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A comparison between various empirical models for TCAD purposes

dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorSuykens, J.
dc.contributor.authorSchoenmaker, Wim
dc.contributor.authorAmza, Claudiu
dc.contributor.authorDima, G.
dc.contributor.authorVandewalle, Joseph
dc.contributor.authorProfirescu, M.
dc.date.accessioned2021-10-14T13:00:58Z
dc.date.available2021-10-14T13:00:58Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4400
dc.sourceIIOimport
dc.titleA comparison between various empirical models for TCAD purposes
dc.typeProceedings paper
dc.contributor.imecauthorGovoreanu, Bogdan
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage315
dc.source.endpage318
dc.source.conferenceProceedings of the 23rd International Semiconductor Conference - CAS
dc.source.conferencedate10/10/2000
dc.source.conferencelocationSinaia Romania
imec.availabilityPublished - open access


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