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Hot carrier degradation and ESD in submicron CMOS technologies: how do they interact?

dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T13:01:24Z
dc.date.available2021-10-14T13:01:24Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4404
dc.sourceIIOimport
dc.titleHot carrier degradation and ESD in submicron CMOS technologies: how do they interact?
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage276
dc.source.endpage286
dc.source.conferenceProceedings 22nd EOS/ESD Symposium;
dc.source.conferencedate26/09/2000
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - open access


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