dc.contributor.author | Canga, Eren | |
dc.contributor.author | Blanco, Victor | |
dc.contributor.author | Charley, Anne-Laure | |
dc.contributor.author | Tabery, Cyrus | |
dc.contributor.author | Zacca, Gabriel | |
dc.contributor.author | Shamma, Nader | |
dc.contributor.author | Kam, Benjamin | |
dc.contributor.author | Brouri, Mohand | |
dc.date.accessioned | 2024-08-26T08:55:00Z | |
dc.date.available | 2024-06-15T17:25:54Z | |
dc.date.available | 2024-08-26T08:55:00Z | |
dc.date.issued | 2024 | |
dc.identifier.isbn | 978-1-5106-7216-1 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:001224296200048 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44052.2 | |
dc.source | WOS | |
dc.title | Overlay Metrology Performance of Dry Photoresist Towards High NA EUV Lithography | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Canga, Eren | |
dc.contributor.imecauthor | Blanco, Victor | |
dc.contributor.imecauthor | Charley, Anne-Laure | |
dc.contributor.orcidimec | Canga, Eren::0000-0002-2322-8070 | |
dc.contributor.orcidimec | Blanco, Victor::0000-0003-4308-0381 | |
dc.contributor.orcidimec | Charley, Anne-Laure::0000-0003-4745-0167 | |
dc.date.embargo | 2024-04-09 | |
dc.identifier.doi | 10.1117/12.3010115 | |
dc.identifier.eisbn | 978-1-5106-7217-8 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 129551R | |
dc.source.conference | Conference on Metrology, Inspection, and Process Control XXXVIII | |
dc.source.conferencedate | FEB 26-29, 2024 | |
dc.source.conferencelocation | San Jose | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 12955 | |
imec.availability | Published - open access | |