dc.contributor.author | Ronse, Kurt | |
dc.date.accessioned | 2025-01-21T11:15:20Z | |
dc.date.available | 2024-07-16T18:13:21Z | |
dc.date.available | 2025-01-21T11:15:20Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 2590-0072 | |
dc.identifier.other | WOS:001263723700001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44165.2 | |
dc.source | WOS | |
dc.title | Continued dimensional scaling through projection lithography | |
dc.type | Journal article review | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.date.embargo | 2024-06-03 | |
dc.identifier.doi | 10.1016/j.mne.2024.100263 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 100263 | |
dc.source.endpage | N/A | |
dc.source.journal | MICRO AND NANO ENGINEERING | |
dc.source.issue | June | |
dc.source.volume | 23 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | The author would like to thank the imec patterning teams (APPM) that have contributed to this work and enabled this article. | |