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dc.contributor.authorRonse, Kurt
dc.date.accessioned2025-01-21T11:15:20Z
dc.date.available2024-07-16T18:13:21Z
dc.date.available2025-01-21T11:15:20Z
dc.date.issued2024
dc.identifier.issn2590-0072
dc.identifier.otherWOS:001263723700001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44165.2
dc.sourceWOS
dc.titleContinued dimensional scaling through projection lithography
dc.typeJournal article review
dc.contributor.imecauthorRonse, Kurt
dc.contributor.orcidimecRonse, Kurt::0000-0003-0803-4267
dc.date.embargo2024-06-03
dc.identifier.doi10.1016/j.mne.2024.100263
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.beginpageArt. 100263
dc.source.endpageN/A
dc.source.journalMICRO AND NANO ENGINEERING
dc.source.issueJune
dc.source.volume23
imec.availabilityPublished - open access
dc.description.wosFundingTextThe author would like to thank the imec patterning teams (APPM) that have contributed to this work and enabled this article.


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