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dc.contributor.authorHantschel, Thomas
dc.contributor.authorPape, U.
dc.contributor.authorSlesazeck, Stefan
dc.contributor.authorNiedermann, P.
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-14T13:02:39Z
dc.date.available2021-10-14T13:02:39Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4416
dc.sourceIIOimport
dc.titleMounting of moulded AFM probes by soldering
dc.typeProceedings paper
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.beginpage62
dc.source.endpage73
dc.source.conferenceMaterials and Device Characterization in Micromachining III
dc.source.conferencedate17/09/2000
dc.source.conferencelocationSanta Clara, CA USA
imec.availabilityPublished - imec
imec.internalnotesProceedings of SPIE; Vol. 4175


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