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Radiation source dependence of degradation in shallow trench isolation diodes

dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorKobayasi, K.
dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorTakami, Y.
dc.contributor.authorTakizawa, H.
dc.contributor.authorMohammadzadeh, A.
dc.date.accessioned2021-10-14T13:03:04Z
dc.date.available2021-10-14T13:03:04Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4420
dc.sourceIIOimport
dc.titleRadiation source dependence of degradation in shallow trench isolation diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage32
dc.source.endpage35
dc.source.conferenceProceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS
dc.source.conferencedate11/09/2000
dc.source.conferencelocationLouvain-la-Neuve Belgium
imec.availabilityPublished - open access


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