Electron-irradiation effects of CMOS integrated circuits with leakage current compensation

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Authors
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takizawa, H.
Conference
Proceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS
Title
Electron-irradiation effects of CMOS integrated circuits with leakage current compensation
Publication type
Proceedings paper
Embargo date
9999-12-31
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