dc.contributor.author | Henson, Kirklen | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-14T13:03:30Z | |
dc.date.available | 2021-10-14T13:03:30Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4424 | |
dc.source | IIOimport | |
dc.title | Scaling induced drain current degradation for low voltage operation of CMOS technology below 100 nm: impact of non-scalable parameters | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.source.peerreview | no | |
dc.source.beginpage | 13 | |
dc.source.endpage | 17 | |
dc.source.conference | Proceedings ULIS Workshop; 20-21 January 2000; Grenoble, France. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |