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Trap-assisted tunneling in high permittivity gate dielectric stacks

dc.contributor.authorHoussa, Michel
dc.contributor.authorTuominen, Marko
dc.contributor.authorNaili, Mohamed
dc.contributor.authorAfanas'ev, V.
dc.contributor.authorStesmans, Andre
dc.contributor.authorHaukka, S.
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-14T13:05:15Z
dc.date.available2021-10-14T13:05:15Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4439
dc.sourceIIOimport
dc.titleTrap-assisted tunneling in high permittivity gate dielectric stacks
dc.typeJournal article
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.source.peerreviewno
dc.source.beginpage8615
dc.source.endpage8620
dc.source.journalJ. Appl. Physics
dc.source.issue12
dc.source.volume87
imec.availabilityPublished - imec


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