dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Rasras, Mahmoud | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | Vandamme, Ewout | |
dc.contributor.author | Badenes, Gonçal | |
dc.date.accessioned | 2021-10-14T13:07:50Z | |
dc.date.available | 2021-10-14T13:07:50Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4462 | |
dc.source | IIOimport | |
dc.title | Impact of MOSFET oxide breakdown on digital circuit operation and reliability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 553 | |
dc.source.endpage | 556 | |
dc.source.conference | IEDM Technical Digest | |
dc.source.conferencedate | 10/12/2000 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |