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Combining TOFSIMS with XPS and AFM to quantify organic surface coverages

dc.contributor.authorKenens, Conny
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-14T13:08:32Z
dc.date.available2021-10-14T13:08:32Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4468
dc.sourceIIOimport
dc.titleCombining TOFSIMS with XPS and AFM to quantify organic surface coverages
dc.typeOral presentation
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewno
dc.source.conferenceQuantitative Surface Analysis-11; 3-7 July 2000; Surrey, UK.
dc.source.conferencelocation
imec.availabilityPublished - imec


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