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ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology

dc.contributor.authorChen, Shih-Hung
dc.contributor.authorFu, Po-Yuan
dc.contributor.authorTsiara, Artemisia
dc.contributor.authorVan De Peer, Myriam
dc.contributor.authorSimicic, Marko
dc.contributor.authorMusibau, Solomon
dc.contributor.authorBan, Yoojin
dc.contributor.authorKao, K. H.
dc.contributor.authorChen, Wen-Chieh
dc.contributor.authorSerbulova, Kateryna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorAbsil, Philippe
dc.contributor.authorCroes, Kristof
dc.date.accessioned2025-06-25T09:40:55Z
dc.date.available2024-12-01T23:12:02Z
dc.date.available2025-06-25T09:40:55Z
dc.date.issued2024
dc.identifier.isbn979-8-3503-6546-7
dc.identifier.issn0739-5159
dc.identifier.otherWOS:001337944800002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44885.2
dc.sourceWOS
dc.titleESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology
dc.typeProceedings paper
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorKao, K. H.
dc.contributor.imecauthorFu, Po-Yuan
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorVan De Peer, Myriam
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorMusibau, Solomon
dc.contributor.imecauthorBan, Yoojin
dc.contributor.imecauthorChen, Wen-Chieh
dc.contributor.imecauthorSerbulova, Kateryna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecVan De Peer, Myriam::0009-0008-6571-4166
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecMusibau, Solomon::0000-0002-7790-8530
dc.contributor.orcidimecBan, Yoojin::0000-0001-7319-8132
dc.contributor.orcidimecChen, Wen-Chieh::0000-0002-1298-6693
dc.contributor.orcidimecSerbulova, Kateryna::0000-0001-7326-9949
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecAbsil, Philippe::0009-0001-5644-1628
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.identifier.doi10.23919/EOS/ESD61719.2024.10702103
dc.identifier.eisbn978-1-58537-353-6
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conference46th Annual Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
dc.source.conferencedateSEP 16-18, 2024
dc.source.conferencelocationReno
dc.source.journalN/A
imec.availabilityPublished - imec


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220.500.12860/44885.2*2025-06-25T09:32:34Zvalidation by library/open access desk
120.500.12860/448852024-12-01T23:12:02Z

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