Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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Authors
Franco, Jacopo; Kaczer, Ben; Groeseneken, Guido
DOI
10.1007/978-94-007-7663-0
EISBN
978-94-007-7663-0
ISBN
978-94-007-7662-3
Title
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Publication type
Book
Embargo date
9999-12-31
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