Publication:

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Date

2014

Book

https://doi.org/10.1007/978-94-007-7663-0

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Published version 14.5 MB

Author(s)

;

;

Groeseneken, Guido

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559 since deposited on 2025-01-13

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Acq. date: 2026-06-06