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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2025-01-13T14:09:17Z
dc.date.available2025-01-13T14:09:17Z
dc.date.issued2014
dc.identifier.isbn978-94-007-7662-3
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45076
dc.titleReliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
dc.typeBook
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.identifier.doi10.1007/978-94-007-7663-0
dc.identifier.eisbn978-94-007-7663-0
dc.source.numberofpages187
dc.source.peerreviewno
imec.availabilityPublished - imec


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