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dc.contributor.authorTemmyo, Yumehito
dc.contributor.authorSoulie, Jean-Philippe
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorTokei, Zsolt
dc.contributor.authorUeno, Kazuyoshi
dc.date.accessioned2025-04-10T13:40:36Z
dc.date.available2025-03-06T20:45:31Z
dc.date.available2025-04-10T13:40:36Z
dc.date.issued2024
dc.identifier.isbn979-8-3503-8518-2
dc.identifier.issn2380-632X
dc.identifier.otherWOS:001411360600059
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45323.2
dc.sourceWOS
dc.titleInvestigation of Graphene Cap Formation on NiAl by Low Temperature Thermal CVD
dc.typeProceedings paper
dc.contributor.imecauthorSoulie, Jean-Philippe
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.orcidimecSoulie, Jean-Philippe::0000-0002-5956-6485
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecTokei, Zsolt::0000-0003-3545-3424
dc.identifier.doi10.1109/IITC61274.2024.10732858
dc.identifier.eisbn979-8-3503-8517-5
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.conference2024 International Interconnect Technology Conference
dc.source.conferencedateJUN 03-06, 2024
dc.source.conferencelocationSan Jose
dc.source.journalN/A
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work was partially supported by the International Research Center for Green Electronics of Shibaura Institute of Technology.


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