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Articles
Toward characterization and assessment of MoS2 fundamental device properties by photoluminescence
Publication:
Toward characterization and assessment of MoS2 fundamental device properties by photoluminescence
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Date
2025-JUL
Journal article
https://doi.org/10.1016/j.mssp.2025.109489
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nuytten, Thomas
;
Minj, Albert
;
Sergeant, Stefanie
;
Smets, Quentin
;
Brems, Steven
;
Kumar, Pawan
;
Ghosh, Souvik
;
Schram, Tom
;
Banerjee, Sreetama
;
Kruv, Anastasiia
;
van Dorp, Dennis
;
Groven, Benjamin
;
Morin, Pierre
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
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155
since deposited on 2025-04-09
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last month
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Acq. date: 2026-01-10
Citations
Metrics
Views
155
since deposited on 2025-04-09
9
last month
1
last week
Acq. date: 2026-01-10
Citations