dc.contributor.author | Nicolett, A. S. | |
dc.contributor.author | Martino, Joao Antonio | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-14T13:28:09Z | |
dc.date.available | 2021-10-14T13:28:09Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4620 | |
dc.source | IIOimport | |
dc.title | A new method to extract the LDD doping concentration on fully depleted SOI nMOSFETs at 300K | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | D45/1 | |
dc.source.endpage | 1-D45/5 | |
dc.source.conference | Proceedings of the 3rd IEEE International Caracas Conference on Devices, Circuits and Systems - ICCDCS | |
dc.source.conferencedate | 15/03/2000 | |
dc.source.conferencelocation | Cancun Mexico | |
imec.availability | Published - open access | |