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dc.contributor.authorRoggen, Jean
dc.contributor.authorRoughton, M.
dc.contributor.authorRadley, D.
dc.date.accessioned2021-10-14T13:39:14Z
dc.date.available2021-10-14T13:39:14Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4695
dc.sourceIIOimport
dc.titleThe work of the GOOD-DIE II network of excellence in Europe on the infrastructure for semiconductor technologies
dc.typeOral presentation
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceESREF - 11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
dc.source.conferencedate2/10/2000
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - open access
imec.internalnotesTutorial 4


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