Why are non-linear microwave measurements so involved?
dc.contributor.author | Rolain, Yves | |
dc.contributor.author | Van Moer, W. | |
dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Schoukens, J. | |
dc.date.accessioned | 2021-10-14T13:40:25Z | |
dc.date.available | 2021-10-14T13:40:25Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4703 | |
dc.source | IIOimport | |
dc.title | Why are non-linear microwave measurements so involved? | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | 55th Spring ARFTG Conference Digest "Going beyond S-Parameters" | |
dc.source.conferencedate | 15/06/2000 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - open access |