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Conference contributions
Measuring mixed signal substrate coupling
Publication:
Measuring mixed signal substrate coupling
Date
2000
Proceedings Paper
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4702.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rolain, Yves
;
Van Moer, W.
;
Vandersteen, Gerd
;
Van Heijningen, Marc
Journal
Abstract
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Acq. date: 2025-10-25
Citations
Metrics
Views
1865
since deposited on 2021-10-14
415
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations