Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures

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Authors

Wuyts, Koen; Watté, J.; Silverans, R. E.; Van Hove, Marleen; Borghs, Gustaaf; Palmstrøm, C. J.; Florez, L. T.; Münder, H.

Journal

Appl. Phys. Lett.

Volume

64

Title

Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures

Publication type

Journal article

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