Modeling of electromigration in interconnects
| dc.contributor.author | Schoenmaker, Wim | |
| dc.date.accessioned | 2021-10-14T13:44:26Z | |
| dc.date.available | 2021-10-14T13:44:26Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4730 | |
| dc.source | IIOimport | |
| dc.title | Modeling of electromigration in interconnects | |
| dc.type | Oral presentation | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | no | |
| dc.source.conference | 2nd International Meeting on Challenges in Predictive Process Simulation - CHIPPS | |
| dc.source.conferencedate | 14/05/2000 | |
| dc.source.conferencelocation | Wandlitz Germany | |
| imec.availability | Published - open access |