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Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures

dc.contributor.authorWuyts, Koen
dc.contributor.authorWatté, J.
dc.contributor.authorSilverans, R. E.
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorPalmstrøm, C. J.
dc.contributor.authorFlorez, L. T.
dc.contributor.authorMünder, H.
dc.date.accessioned2021-09-29T12:54:08Z
dc.date.available2021-09-29T12:54:08Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/473
dc.sourceIIOimport
dc.titleBack side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures
dc.typeJournal article
dc.contributor.imecauthorBorghs, Gustaaf
dc.source.peerreviewno
dc.source.beginpage2406
dc.source.endpage2408
dc.source.journalAppl. Phys. Lett.
dc.source.volume64
imec.availabilityPublished - imec


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