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Conference contributions
Displacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications
Publication:
Displacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications
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Date
2000
Proceedings Paper
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4747.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Mohammadzadeh, A.
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Abstract
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1911
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations
Metrics
Views
1911
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations