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Identification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorNeimash, V. B.
dc.contributor.authorKraitchinskii, A.
dc.contributor.authorKras'ko, M.
dc.contributor.authorPuzenko, O.
dc.contributor.authorBlondeel, A.
dc.contributor.authorClauws, P.
dc.contributor.authorPattyn, Hugo
dc.contributor.authorKoops, G.E.J.
dc.contributor.authorPattyn, H.
dc.date.accessioned2021-10-14T13:47:31Z
dc.date.available2021-10-14T13:47:31Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4750
dc.sourceIIOimport
dc.titleIdentification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorPattyn, Hugo
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageCM41
dc.source.conferenceGeneral Scientific Meeting Belgische Natuurkundige Vereniging / Société Belge de Physique
dc.source.conferencedate25/05/2000
dc.source.conferencelocationLouvain-la-Neuve Belgium
imec.availabilityPublished - imec


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