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Design experiment for measurement and modeling of digital substrate noise generation

dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorCompiet, John
dc.contributor.authorWambacq, P.
dc.contributor.authorDonnay, Stephane
dc.date.accessioned2021-10-14T13:59:23Z
dc.date.available2021-10-14T13:59:23Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4824
dc.sourceIIOimport
dc.titleDesign experiment for measurement and modeling of digital substrate noise generation
dc.typeOral presentation
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.conferenceWorkshop on Substrate Effects in Smart-Power and Mixed-Signal ICs
dc.source.conferencedate14/09/2000
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - imec


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