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Non-volatile memory reliability

dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-14T14:00:43Z
dc.date.available2021-10-14T14:00:43Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4832
dc.sourceIIOimport
dc.titleNon-volatile memory reliability
dc.typeOral presentation
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceESREF - 11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
dc.source.conferencedate2/10/2000
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - open access
imec.internalnotesTutorial


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