Show simple item record

New shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistors

dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-14T14:02:00Z
dc.date.available2021-10-14T14:02:00Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4840
dc.sourceIIOimport
dc.titleNew shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistors
dc.typeProceedings paper
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage348
dc.source.endpage351
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
4843.pdf
Size:
76.37Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record