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Performance of 0.1 μm partially-depleted SOI CMOS: a comparison to bulk

dc.contributor.authorvan Meer, Hans
dc.contributor.authorLyu, Jeong-ho
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-14T14:02:38Z
dc.date.available2021-10-14T14:02:38Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4844
dc.sourceIIOimport
dc.titlePerformance of 0.1 μm partially-depleted SOI CMOS: a comparison to bulk
dc.typeProceedings paper
dc.contributor.imecauthorDe Meyer, Kristin
dc.source.peerreviewno
dc.source.beginpage2.2
dc.source.conferenceProceedings of the Silicon on Insulator Development and Application Workshop; 6-7 September 2000.
dc.source.conferencelocation
imec.availabilityPublished - imec


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