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Nanometer scale characterization of deep submicron devices
Publication:
Nanometer scale characterization of deep submicron devices
Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Clarysse, Trudo
;
Duhayon, Natasja
;
Eyben, Pierre
;
Hantschel, Thomas
;
Trenkler, Thomas
;
Xu, Mingwei
Journal
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2044
since deposited on 2021-10-14
426
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2044
since deposited on 2021-10-14
426
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations