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Extended wavelength in InGaAs detectors grown by Metal-Organic Vapor Phase Epitaxy (MOVPE) on compliant substrates

dc.contributor.authorVanhollebeke, Koen
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorVan Daele, Peter
dc.contributor.authorDemeester, Piet
dc.date.accessioned2021-10-14T14:11:28Z
dc.date.available2021-10-14T14:11:28Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4897
dc.sourceIIOimport
dc.titleExtended wavelength in InGaAs detectors grown by Metal-Organic Vapor Phase Epitaxy (MOVPE) on compliant substrates
dc.typeOral presentation
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.imecauthorVan Daele, Peter
dc.contributor.imecauthorDemeester, Piet
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.contributor.orcidimecVan Daele, Peter::0000-0003-0557-7741
dc.contributor.orcidimecDemeester, Piet::0000-0003-2810-3899
dc.source.peerreviewno
dc.source.conferenceEOS/SPIE Remote Sensing Symposium
dc.source.conferencedate23/09/2000
dc.source.conferencelocationBarcelona Spain
imec.availabilityPublished - imec


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