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Formalized three-layer system-level reuse model and methodology for embedded data-dominated applications

dc.contributor.authorVermeulen, Frederik
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVerkest, Diederik
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-10-14T14:15:30Z
dc.date.available2021-10-14T14:15:30Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4920
dc.sourceIIOimport
dc.titleFormalized three-layer system-level reuse model and methodology for embedded data-dominated applications
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage92
dc.source.endpage98
dc.source.conferenceProceedings Design, Automation and Test in Europe Conference and Exhibition
dc.source.conferencedate27/03/2000
dc.source.conferencelocationParis France
imec.availabilityPublished - open access


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