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Stability and reliability of SiGe HBTs for BiCMOS applications

dc.contributor.authorJain, Suresh
dc.contributor.authorMehra, Anupama
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T14:26:48Z
dc.date.available2021-10-14T14:26:48Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4984
dc.sourceIIOimport
dc.titleStability and reliability of SiGe HBTs for BiCMOS applications
dc.typeProceedings paper
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage155
dc.source.endpage158
dc.source.conferenceProceedings International Conference on Communications, Computers and Devices - ICCCD
dc.source.conferencedate14/12/2000
dc.source.conferencelocationKharagpur India
imec.availabilityPublished - imec


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