Browsing Articles by imec author "0e60cb089d219c0828aa30209054a06c04a5d70c"
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3D SRAM Macro Design in 3D Nanofabric Process Technology
Abdi, Dawit; Salahuddin, Shairfe Muhammad; Boemmels, Juergen; Giacomin, Edouard; Weckx, Pieter; Ryckaert, Julien; Hellings, Geert; Catthoor, Francky (2023) -
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Vaisman Chasin, Adrian; Linten, Dimitri; Parvais, Bertrand; Catthoor, Francky; Rzepa, Gerhard; Waltl, Michael; Grasser, Tibor (2018) -
A Comprehensive Study of Nanosheet and Forksheet SRAM for Beyond N5 Node
Gupta, Mohit; Weckx, Pieter; Schuddinck, Pieter; Jang, Doyoung; Chehab, Bilal; Cosemans, Stefan; Ryckaert, Julien; Dehaene, Wim (2021) -
Analysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processors
Duch, Loris; Peon-Quiros, Miguel; Weckx, Pieter; Levisse, Alex; Braojos, Ruben; Catthoor, Francky; Atienza, David (2020) -
Atomistic pseudo-transient BTI simulation with inherent workload memory
Rodopoulos, D.; Weckx, Pieter; Noltsis, M.; Catthoor, Francky; Soudris, D. (2014) -
CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling
Liu, Hsiao-Hsuan; Salahuddin, Shairfe Muhammad; Chan, Boon Teik; Schuddinck, Pieter; Xiang, Yang; Hellings, Geert; Weckx, Pieter; Ryckaert, Julien; Catthoor, Francky (2023) -
CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
Liu, Hsiao-Hsuan; Schuddinck, Pieter; Pei, Zhenlin; Verschueren, Lynn; Mertens, Hans; Salahuddin, Shairfe Muhammad; Hiblot, Gaspard; Xiang, Yang; Chan, Boon Teik; Subramanian, Sujith; Weckx, Pieter; Hellings, Geert; Garcia Bardon, Marie; Ryckaert, Julien; Pan, Chenyun; Catthoor, Francky (2023) -
Comparison of NBTI aging on adder architectures and ring oscillators in the downscaled technologies
Kosemura, Daisuke; Weckx, Pieter; Morrison, Sebastien; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Raghavan, Praveen; Kaczer, Ben; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2015) -
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Kukner, Halil; Khan, Seyab; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
COMPHY - A compact-physics framework for unified modeling of BTI
Rzepa, Gerhard; Franco, Jacopo; O'Sullivan, Barry; Subirats, Alexandre; Simicic, Marko; Hellings, Geert; Weckx, Pieter; Jech, M.; Knobloch, T.; Waltl, M.; Roussel, Philippe; Linten, Dimitri; Kaczer, Ben; Grasser, T. (2018) -
Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3 nm Era
Sisto, Giuliano; Zografos, Odysseas; Chehab, Bilal; Kakarla, Naveen; Xiang, Yang; Milojevic, Dragomir; Weckx, Pieter; Hellings, Geert; Ryckaert, Julien (2022) -
Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
Liu, Hsiao-Hsuan; Salahuddin, Shairfe Muhammad; Abdi, Dawit; Chen, Rongmei; Weckx, Pieter; Matagne, Philippe; Catthoor, Francky (2022) -
Extraction of statistical gate oxide parameters from large MOSFET arrrays
Stampfer, Bernhard; Simicic, Marko; Weckx, Pieter; Abbasi, Arash; Kaczer, Ben; Grasser, Tibor; Waltl, Michael (2020) -
Impact and mitigation of sense amplifier aging degradation using realistic workloads
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2017) -
Impact and mitigation of SRAM read path aging
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2018) -
Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC
Sankatali, Venkateswarlu; Mishra, Subrat; Oprins, Herman; Vermeersch, Bjorn; Brunion, Moritz; Han, Jun-Han; Stan, Mircea R.; Biswas, Dwaipayan; Weckx, Pieter; Catthoor, Francky (2023) -
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2013) -
Implications of BTI-induced time-dependent statistics on yield estimation of digital circuits
Weckx, Pieter; Kaczer, Ben; Toledano Luque, Maria; Raghavan, Praveen; Franco, Jacopo; Roussel, Philippe; Groeseneken, Guido; Catthoor, Francky (2014) -
Increasing Functionality of Wafer's Backside: Analysis of Si and WS2 Backside Power-Switch
Mirabelli, Gioele; Chen, Rongmei; Ahmed, Zubair; Chehab, Bilal; Zografos, Odysseas; Hiblot, Gaspard; Weckx, Pieter; Hellings, Geert; Ryckaert, Julien (2023) -
Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017)