Authors

Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido

ISSN

0141-9331

Issue

8_A

Journal

Microprocessors and Microsystems

Volume

37

Title

Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model

Publication type

Journal article