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Articles
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
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Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kukner, Halil
;
Weckx, Pieter
;
Raghavan, Praveen
;
Kaczer, Ben
;
Catthoor, Francky
;
Van der Perre, Liesbet
;
Lauwereins, Rudy
;
Groeseneken, Guido
Journal
Microprocessors and Microsystems
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1923
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Acq. date: 2025-12-15
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Views
1923
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-15
Citations