Browsing Articles by imec author "2f8cc06f440a3bbf291b3ca9d27b5b3f515a5442"
Now showing items 1-6 of 6
-
Critical dimension metrology using Raman spectroscopy
Gawlik, Andrzej; Bogdanowicz, Janusz; Nuytten, Thomas; Charley, Anne-Laure; Teugels, Lieve; Misiewicz, Jan; Vandervorst, Wilfried (2020) -
Direct and indirect optical transitions in bulk and atomically thin MoS2 studied by photoreflectance and photoacoustic spectroscopy
Kopaczek, Jan; Zelewski, Szymon; Polak, Maciej; Gawlik, Andrzej; Chiappe, Daniele; Schulze, Andreas; Caymax, Matty; Kudrawiec, Robert (2019) -
Enhanced light coupling into periodic arrays of nm-scale semiconducting fins
Gawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Nuytten, Thomas; Tarnowski, Karol; Misiewicz, Jan; Vandervorst, Wilfried (2018) -
Nanofocusing of light into semiconducting fin photonic crystals
Bogdanowicz, Janusz; Nuytten, Thomas; Gawlik, Andrzej; Schulze, Andreas; De Wolf, Ingrid; Vandervorst, Wilfried (2016) -
Size-dependent optical properties of periodic arrays of semiconducting nanolines
Gawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Morin, Pierre; Misiewicz, Jan; Vandervorst, Wilfried (2020) -
Strain and compositional analysis of (Si)Ge fin structures using high resolution X-ray diffraction
Schulze, Andreas; Loo, Roger; Witters, Liesbeth; Mertens, Hans; Gawlik, Andrzej; Horiguchi, Naoto; Collaert, Nadine; Wormington, Matthew; Ryan, Paul; Vandervorst, Wilfried; Caymax, Matty (2017)