Publication:
Strain and compositional analysis of (Si)Ge fin structures using high resolution X-ray diffraction
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1969 since deposited on 2021-10-24
4last month
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Acq. date: 2026-08-30
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Statistics
Views
1969 since deposited on 2021-10-24
4last month
1last week
Acq. date: 2026-08-30
Citations