Publication:
Strain and compositional analysis of (Si)Ge fin structures using high resolution X-ray diffraction
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1964 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-11
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Metrics
Views
1964 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-11
Citations