Publication:
Strain and compositional analysis of (Si)Ge fin structures using high resolution X-ray diffraction
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1961 since deposited on 2021-10-24
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Acq. date: 2025-10-25
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Views
1961 since deposited on 2021-10-24
465item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations