Browsing Articles by imec author "5c7482e611cc5bbfdfca0137f83ae51de2d072ff"
Now showing items 1-5 of 5
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A MOS capacitor model for ultra-thin 2D semiconductors: the impact of interface defects and channel resistance
Gaur, Abhinav; Agarwal, Tarun; Asselberghs, Inge; Radu, Iuliana; Heyns, Marc; Lin, Dennis (2020) -
Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2
Gaur, Abhinav; Chiappe, Daniele; Lin, Dennis; Cott, Daire; Asselberghs, Inge; Heyns, Marc; Radu, Iuliana (2019) -
Demonstration of 2e12/cm-2-eV-1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5nm EOT
Gaur, Abhinav; Balaji, Yashwanth; Lin, Dennis; Adelmann, Christoph; Van Houdt, Jan; Heyns, Marc; Mocuta, Dan; Radu, Iuliana (2017) -
Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra
Shlyakhov, Ilya; Iakoubovskii, K.; Banerjee, Sreetama; Gaur, Abhinav; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana; Chai, J.; Yang, M.; Wang, S. J.; Houssa, Michel; Stesmans, A.; Afanas'ev, V. (2021) -
MoS2 functionalization with a Sub-nm thin SiO2 layer for atomic layer deposition of high-k dielectrics
Zhang, Haodong; Arutchelvan, Goutham; Meersschaut, Johan; Gaur, Abhinav; Conard, Thierry; Bender, Hugo; Lin, Dennis; Asselberghs, Inge; Heyns, Marc; Radu, Iuliana; Vandervorst, Wilfried; Delabie, Annelies (2017)