Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2

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Authors

Gaur, Abhinav; Chiappe, Daniele; Lin, Dennis; Cott, Daire; Asselberghs, Inge; Heyns, Marc; Radu, Iuliana

ISSN

2053-1583

Issue

3

Journal

2D Materials

Volume

6

Title

Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2

Publication type

Journal article

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