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Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2
Publication:
Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2
Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaur, Abhinav
;
Chiappe, Daniele
;
Lin, Dennis
;
Cott, Daire
;
Asselberghs, Inge
;
Heyns, Marc
;
Radu, Iuliana
Journal
2D Materials
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1959
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1959
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations