Publication:
Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2
Date
| dc.contributor.author | Gaur, Abhinav | |
| dc.contributor.author | Chiappe, Daniele | |
| dc.contributor.author | Lin, Dennis | |
| dc.contributor.author | Cott, Daire | |
| dc.contributor.author | Asselberghs, Inge | |
| dc.contributor.author | Heyns, Marc | |
| dc.contributor.author | Radu, Iuliana | |
| dc.contributor.imecauthor | Gaur, Abhinav | |
| dc.contributor.imecauthor | Lin, Dennis | |
| dc.contributor.imecauthor | Cott, Daire | |
| dc.contributor.imecauthor | Asselberghs, Inge | |
| dc.contributor.imecauthor | Heyns, Marc | |
| dc.contributor.imecauthor | Radu, Iuliana | |
| dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
| dc.date.accessioned | 2021-10-27T09:32:51Z | |
| dc.date.available | 2021-10-27T09:32:51Z | |
| dc.date.issued | 2019 | |
| dc.identifier.issn | 2053-1583 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33017 | |
| dc.identifier.url | https://doi.org/10.1088/2053-1583/ab20fb | |
| dc.source.beginpage | 35035 | |
| dc.source.issue | 3 | |
| dc.source.journal | 2D Materials | |
| dc.source.volume | 6 | |
| dc.title | Analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2 | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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