Publication:
Demonstration of 2e12/cm-2-eV-1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5nm EOT
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1942 since deposited on 2021-10-24
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Acq. date: 2026-08-07
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Views
1942 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-08-07
Citations