Publication:
Demonstration of 2e12/cm-2-eV-1 2D-oxide interface trap density on back-gated MoS2 flake devices with 2.5nm EOT
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1940 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-16
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Metrics
Views
1940 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-16
Citations