Browsing Articles by author "Nackaerts, Axel"
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Direct measurement of top and sidewall interface trap density in SOI FinFETs
Kapila, Gautam; Kaczer, Ben; Nackaerts, Axel; Collaert, Nadine; Groeseneken, Guido (2007-03) -
Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, Ben; de Potter de ten Broeck, Muriel; Verbeeck, Rita; Nackaerts, Axel (2009) -
Litho enhancements for 45nm-node MuGFETs
Verhaegen, Staf; Ercken, Monique; Nackaerts, Axel; Vandenberghe, Geert (2005) -
Multi-gate devices for the 32nm technology node and beyond
Collaert, Nadine; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Lai, Li-Shyue; Lenoble, Damien; Mercha, Abdelkarim; Nackaerts, Axel; Pawlak, Bartek; Rooyackers, Rita; Schulz, Thomas; San, Kemal Tamer; Son, Nak Jin; Van Dal, Mark; Verheyen, Peter; von Arnim, Klaus; Witters, Liesbeth; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008)