Publication:

Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

Date

2009
Journal article
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Author(s)

Griffoni, Alessio
;
Silvestri, Marco
;
Gerardin, Simone
;
Meneghesso, Gaudenzio
;
Paccagnella, Alessandro
;
Kaczer, Ben  
;
de Potter de ten Broeck, Muriel  
;
Verbeeck, Rita  
;
Nackaerts, Axel

Journal

IEEE Transactions on Nuclear Science

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1993 since deposited on 2021-10-17
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