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Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
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Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
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Date
2009
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, Alessio
;
Silvestri, Marco
;
Gerardin, Simone
;
Meneghesso, Gaudenzio
;
Paccagnella, Alessandro
;
Kaczer, Ben
;
de Potter de ten Broeck, Muriel
;
Verbeeck, Rita
;
Nackaerts, Axel
Journal
IEEE Transactions on Nuclear Science
Abstract
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1992
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Acq. date: 2026-01-11
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Views
1992
since deposited on 2021-10-17
2
last month
2
last week
Acq. date: 2026-01-11
Citations