Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

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Author(s)

Griffoni, Alessio

;

Silvestri, Marco

;

Gerardin, Simone

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Meneghesso, Gaudenzio

;

Paccagnella, Alessandro

;

;

de Potter de ten Broeck, Muriel

;

;

Nackaerts, Axel

Journal

IEEE Transactions on Nuclear Science

Metrics

1990 since deposited on 2021-10-17

Acq. date: 2025-12-08