Browsing Articles by imec author "c1e76b6104c8a55a57059706530f1c65b4809176"
Now showing items 1-1 of 1
-
3D-printed optical probes for wafer-level testing of photonic integrated circuits
Trappen, Mareike; Blaicher, Matthias; Dietrich, Philipp-Immanuel; Dankwart, Colin; Xu, Yilin; Hoose, Tobias; Billah, Muhammad Rodlin; Abbasi, Amin; Baets, Roel; Troppenz, Ute; Theurer, Michael; Woerhoff, Kerstin; Seyfried, Moritz; Freude, Wolfgang; Koos, Christian (2020)