Browsing Articles by author "Paccagnella,"

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Total-ionizing-dose effects and low-frequency noise in 16-nm InGaAs FinFETs with HfO2/Al2O3 dielectrics

Bonaldo,; Zhao,; O Hara,; Gorchichko,; Zhang,; Gerardin,; Paccagnella,; Waldron, Niamh; Collaert, Nadine; Putcha, Vamsi; Linten, Dimitri; Pantelides,; Reed,; Schrimpf,; Fleetwood, (2020)